Description: Structural, Syntactic, and Statistical Pattern Recognition Please note: this item is printed on demand and will take extra time before it can be dispatched to you (up to 20 working days). Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014, Proceedings Author(s): Pasi Franti, Gavin Brown, Marco Loog, Francisco Escolano, Marcello Pelillo Format: Paperback Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG, Germany Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K ISBN-13: 9783662444146, 978-3662444146 Synopsis This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2014; comprising the International Workshop on Structural and Syntactic Pattern Recognition, SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The total of 25 full papers and 22 poster papers included in this book were carefully reviewed and selected from 78 submissions. They are organized in topical sections named: graph kernels; clustering; graph edit distance; graph models and embedding; discriminant analysis; combining and selecting; joint session; metrics and dissimilarities; applications; partial supervision; and poster session.
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Book Title: Structural, Syntactic, and Statistical Pattern Recognition
Number of Pages: 478 Pages
Language: English
Publication Name: Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014, Proceedings
Publisher: Springer-Verlag Berlin AND Heidelberg Gmbh & Co. KG
Publication Year: 2014
Subject: Computer Science
Item Height: 235 mm
Item Weight: 7489 g
Type: Textbook
Author: Marcello Pelillo, Pasi Franti, Gavin Brown, Marco Loog, Francisco Escolano
Series: Image Processing, Computer Vision, Pattern Recognition, and Graphics
Item Width: 155 mm
Format: Paperback
