Description: Secondary Ion Mass Spectrometry : Applications for Depth Profiling and Surface Characterization, Paperback by Stevie, Fred A., ISBN 1606505882, ISBN-13 9781606505885, Brand New, Free shipping in the US This book was written to explain a technique that requires an understanding of many details in order to properly obtain and interpret the data obtained. It also will serve as a reference for those who need to provide SIMS data. Th has over 200 figures and the references allow one to trace development of SIMS and understand the many details of the technique.
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Book Title: Secondary Ion Mass Spectrometry : Applications for Depth Profilin
Author: Stevie, Fred A.
Language: english
