Description: Measuring Success : Testing, Grades, and the Future of College Admissions, Hardcover by Buckley, Jack (EDT); Letukas, Lynn (EDT); Wildavsky, Ben (EDT), ISBN 1421424967, ISBN-13 9781421424965, Brand New, Free shipping in the US "Once touted as the single best way to measure students from diverse backgrounds, schools, and experiences, standardized college admissions tests are now criticized for being hopelessly biased in favor of traditionally privileged groups. Out of this has emerged the test-optional movement that seeks to allow students to apply to schools without sitting through the rigors of the SAT. This book takes a step back and applies rigorous empirical measurements to these rival claims. Drawing upon the expertise ofhigher education researchers, admissions officers, enrollment managers, and policy professionals, this edited volume is among the first to investigate the research and policy implications of test-optional practices. It was conceived in response to the editors' frustration with the fragmented and incomplete state of the literature around the contemporary debate on college admissions testing. Many students, teachers, parents, policymakers--frankly, nearly anyone immediately outside the testing industry andcollege admissions--have little understanding of how admissions tests are used. This lack of transparency has often fueled beliefs that college assessments are biased, misused, or overused. Decades of research on various aspects of testing, such as the predictive validity of assessments, makes a compelling case for their value. But all-too-frequently researchers and admissions officers talk past one another instead of engaging substantively. This collection intends to remedy the situation by bringing these disparate voices together. This book is designed for provosts, enrollment managers, and college admissions officers seeking to strike the proper balance between uniformity and fairness"--
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Book Title: Measuring Success : Testing, Grades, and the Future of College Ad
Author: Buckley, Jack (EDT); Letukas, Lynn (EDT); Wildavsky, Ben (EDT)
Language: english
