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Fundamentals of Silicon Carbide Technology : Growth, Characterization, Device...

Description: Fundamentals of Silicon Carbide Technology : Growth, Characterization, Devices and Applications, Hardcover by Kimoto, Tsunenobu; Cooper, James A., ISBN 1118313526, ISBN-13 9781118313527, Brand New, Free shipping in the US Electrical engineers Kimoto and Cooper describe silicon carbide as a wide-bandgap semiconductor with superior physical and electrical properties that can serve as the basis for the high-voltage, low-loss power electronics of the future. Silicon power devices--the workhorse for decades--are now approaching performance limits imposed by the fundamental material properties of silicon, they say, and must be replaced with more robust semiconductors. Their topics are physical properties of silicon carbide, bulk growth, epitaxial growth, characterization techniques and defects, device processing, unipolar and bipolar power diodes, unipolar and bipolar power switching devices, optimizing and comparing power devices, applying silicon carbide devices in power systems, and specialized silicon carbide devices and applications. Annotation ©2015 Ringgold, Inc., Portland, OR ()

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Fundamentals of Silicon Carbide Technology : Growth, Characterization, Device...

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Book Title: Fundamentals of Silicon Carbide Technology : Growth, Characteriza

Number of Pages: 400 Pages

Language: English

Publication Name: Fundamentals of Silicon Carbide Technology : Growth, Characterization, Devices and Applications

Publisher: Wiley & Sons, Incorporated, John

Subject: Electronics / Semiconductors, Chemistry / General

Item Height: 1.3 in

Publication Year: 2014

Item Weight: 39.3 Oz

Type: Textbook

Item Length: 9.7 in

Author: James A. Cooper, Tsunenobu Kimoto

Subject Area: Technology & Engineering, Science

Series: IEEE Press Ser.

Item Width: 6.6 in

Format: Hardcover

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