Description: Aberration-corrected Imaging In Transmission Electron Microscopy: An Introduction (2nd Edition)Author(s): Rolf Erni Format: Hardback Publisher: Imperial College Press, United Kingdom Imprint: Imperial College Press ISBN-13: 9781783265282, 978-1783265282 Synopsis Aberration-Corrected Imaging in Transmission Electron Microscopy provides an introduction to aberration-corrected atomic-resolution electron microscopy imaging in materials and physical sciences. It covers both the broad beam transmission mode (TEM; transmission electron microscopy) and the scanning transmission mode (STEM; scanning transmission electron microscopy). The book is structured in three parts. The first part introduces the basics of conventional atomic-resolution electron microscopy imaging in TEM and STEM modes. This part also describes limits of conventional electron microscopes and possible artefacts which are caused by the intrinsic lens aberrations that are unavoidable in such instruments. The second part introduces fundamental electron optical concepts and thus provides a brief introduction to electron optics. Based on the first and second parts of the book, the third part focuses on aberration correction; it describes the various aberrations in electron microscopy and introduces the concepts of spherical aberration correctors and advanced aberration correctors, including correctors for chromatic aberration. This part also provides guidelines on how to optimize the imaging conditions for atomic-resolution STEM and TEM [url] second edition has been completely revised and updated in order to incorporate the very recent technological and scientific achievements that have been realized since the first edition appeared in 2010.
Price: 69.21 GBP
Location: Aldershot
End Time: 2024-02-02T12:16:53.000Z
Shipping Cost: 36.56 GBP
Product Images
Item Specifics
Return postage will be paid by: Buyer
Returns Accepted: Returns Accepted
After receiving the item, your buyer should cancel the purchase within: 60 days
Return policy details:
Book Title: Aberration-corrected Imaging In Transmission Electron Microsco...
Author: Rolf Erni
Publication Name: Aberration-Corrected Imaging in Transmission Electron Microscopy: an Introduction (2nd Edition)
Format: Hardcover
Language: English
Publisher: Imperial College Press
Subject: Science
Publication Year: 2015
Type: Textbook
Number of Pages: 432 Pages
